Atomic Force Microscope
The AFM is the ideal multiple-user system for Scanning Probe Microscope (SPM). This SPM provides a wealth of unique technological features, including precision temperature control and industry-leading environmental control.
Classic AFM imaging and other cutting edge modes for thorough atomic scale characterization
General Features:-
- ContactMode, TappingMode, PhaseImaging, ScanAsyst, HarmoniX, PeakForceQNM, LiftModeTM, Dark Lift, Nano-I ndentation, Nanolithography, Force Volume, Piezo Response, Force Modulation, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Electric Force Microscopy (EFM), Surface Potential, Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance, Microscopy (SSRM), Conductive Atomic Force Microscopy (CAFM), Scanning Tunneling Microscopy (STM).
AFM Overview
Description: In atomic force microscopy (AFM) a sharp probe is used for attaining resolutions approaching atomic or molecular scale and obtain 3D surface topography. Scanning is done with the help of piezo scanners. Imaging can be performed in air and liquid medium for topography and used for mechanical property measurements. Electrical methods can be performed in air medium.
AFM 2 : Bruker Dimension Icon Specifications:
Tapping mode, Scan Asyst mode, contact mode for topography – in air and fluid.
Contact mode for Force distance spectroscopy – in air and fluid
PFQNM – Peak force quantitative nano mechanical mapping for sample surface mechanical properties measurement – in air and fluid
EFM – Electrostatic force microscopy for qualitative information of electric field gradient
KPFM – Kelvin probe force microscopy for surface work potential measurement
PFM – Piezo force microscopy for characterization of piezo electric and ferro electric materials
MFM – Magnetic force microscopy for mapping the magnetic field distributions on a microscopic scale
LFM – Lateral force microscopy to investigate surface frictional properties
FMM – Force modulation microscopy for sample surface mechanical properties
Park NX20 AFM Specifications:
True non-contact mode, Tapping mode, contact mode for topography – in air and fluid
Contact mode for Force distance spectroscopy – in air and fluid
Pin-point spectroscopy for mechanical properties measurement – in air and fluid
C-AFM – Conductive AFM for current mapping and I-V characterization
EFM – Electrostatic force microscopy for qualitative information of electric field gradient
KPFM – Kelvin probe force microscopy for surface work potential measurement
PFM – Piezo force microscopy for characterization of piezo electric and ferro-electric materials
MFM – Magnetic force microscopy for mapping the magnetic field distributions on a microscopic scale
LFM – Lateral force microscopy to investigate surface frictional properties
FMM – Force modulation microscopy for sample surface mechanical properties
Micro System Analyzer 500
The MSA-500 provides precise 3-D dynamic and static response data that simplifies troubleshooting, enhances and shortens design cycles, improves yield and performance, and reduces product cost. This outstanding degree of innovation has been recognized by two prestigious awards: the 2005 Sensor Innovation Award and the Photonics Circle of Excellence for the development of microscope-based scanning vibrometry.
One stop solution for all your MEMS device characterization requirements
General Features:-
- Full-field vibration mapping and broadband, out-of-plane frequency response information, High density sample grids with up to 512 x 512 user-defined measurement Points.
- Submicron laser probe spot for measuring very small structures and details.
- Stroboscopic Video Microscopy for In-Plane Motion Detection, detection up to 1 MHz
- Time-domain displacement measurements with nanometer resolution
- White Light Interferometry for the Acquisition of Topography Data
- Rapid, non-contact 3-D topography measurement with sub-nanometer Resolution
- Stroboscopic Video Microscopy for In-Plane Motion Detection
- Time-domain displacement measurements with nanometer resolution , Integrated signal generator for step response, ring down and Bode plot measurements , Time-saving, automatic multi-band processing
- Full-field vibration mapping and broadband, out-of-plane frequency response information , Displays frequency-domain and time-domain data, simplifying transient response analysis , High density sample grids with up to 512 x 512 user-defined measurement points , Versatile data import and export interfaces to validate FE models, Submicron laser probe spot for measuring very small structures and details , Laser dimmer for optimized measurement conditions
Non Contact Optical Profiler
Sub-nanometric 3D non contact profiling for indepth surface morphology analysis. This peice of equipment merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology. Film thickness measurement from 5 microns down to 300 nm or less 4 million pixel camera for high resolution imaging over a large area Auto-range and auto-fringe-find for ease of use of Single mode of operation over all scan ranges.
General Features:-
- For the measurement of non-contact surface roughness, step-heights, form, shape, angular and critical dimension results. The TalySurf CCI is an advanced 3-dimensional noncontact optical metrology tool used for advanced surface characterization. These instruments have the ability to offer a true topographical representation of a surface with 0.4 to 0.6 µm lateral resolution.
- This instrument allows us to perform measurement and analysis of the measured results. The 4155C/4156C can perform Stress testing along with three types of measurements namely: Sweep measurement, Sampling measurement, Quasi static CV measurement
- All material types are measurable including: glass, liquid inks, photo resist, metal, polymer and pastes.
Scanning Acoustic Microscope, KSI v400
Non destructive high resolution sub-layer ultrasonic imaging
SAM is a high-performance tool enabling non destructive acoustic investigations for dedicated high throughput analysis, quality control and research applications. It features a new high speed maintenance free stage and new RF and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface .
General Features:-
- Avialable transducer:-50,100,150,230MHz.
- Scanning modes: A, B, C, D, 3D, seqence,auto , p(profile) and X-scan,
- HQ, FFT, B-scan with quantitiative Measurement
- Material spectrocpoy through acosutic iimpedance analysis
- Maximun scan area 400*400mm.
Micro UTM
UTM is used for tension, compression, dynamic fatigue and torsion testing. They are deployed in a diverse set of applications from biomedical components to biomaterials, from paper and board, to elasticated fabrics and textiles, from wire and foil, to tape and adhesives, from elastomers and plastics, to metals and specialized product tests.
Load cells: 25N to 10kN
Speed range:1mm/min to 1000mm/min
General Features:-
- Studies like Tensile, strain measurements can be done over wide range Of fields,few like mentioned below :-
Adhesives – Biomaterials – Biomechanics -Ceramics – Chords Composites — Electronic Components and Materials – Films – Foam -Gasket Material -Glass – Labels – Medical Devices – Metals -Paper Products -Plastics – Rubber – Seals, Textiles – Wire etc
Anton Paar Modular Compact Rheometer- 302 (MCR-302)
| Technical Specifications | MRC302 |
| Bearing | Air |
| EC motor | yes |
| Maximum torque | 200 |
| Minimum torque rotation | 1 |
| Minimum torque oscillation | 0.5 |
| angular deflection | 0.05 to ∞ |
| Min. angular velocity | 10^-9 |
| Max. angular velocity | 314 |
| Max speed | 3000 |
| Min. angular frequency | 10-7 |
| Max. angular frequency | 628c |
| Normal force range | 0.005-50 |
| Normal force resolution | 0.5 |
| Temperature range | -40°C to 180°C |
General Use: It is used for measuring viscosity , viscoelasticity of fluids and studying stress deformation relationships in the fluids
Accessories: Cone plate CP 40, Cone plate CP 50 , Parallel Plate PP 25
Measurement Modes: Concentric Measuring System, Parallel Plate measuring System
Other instruments
| Name of the Instrument | Vendor / Model | Specifications |
|---|---|---|
| Precision Nano Displacement System (PNDS) | Radiant Technologies, Inc. | piezo response upto 100V |
| Micro Shaker | Brüel & Kjær Sound & Vibration Measurement LDS® V406 | Max acceleration: 5g Displacement continuous peak-peak 7mm Max. Frequency 1000Hz |
| Dual axis Rate Table (-20ºC to 70ºC) | Motion Dynamics /TES 3H3 TG | Max Rate Inner/Outer axis(±1500 deg/sec and ±250 deg/sec) |
