mncf.cense.iisc.ac.in   |    +91 22933253
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Your One Source for Materials, Device Characterization and Analysis

The MNCF offers a wide variety of material and device characterization services enabled by the more than 50 pieces of equipment housed under a single roof at CeNSE, IISc, together with experienced staff. We also network with other laboratories to enhance the breadth of our services and are in collaborative agreements with instrument manufacturers and suppliers, allowing us to offer characterization services not available from a single source in India or abroad. As CeNSE also houses the National Nano Fabrication Facility and a number of other research laboratories, we are able, when called for, to tap into in-house expertise in multi-disciplinary domains like MEMS-NEMS, Nanoelectronics Devices, Sensors, Circuits, Plasmonics, Polymer Bio Sensors, Micro-Nano Fluidics, Microsystems Packaging, Growth of IIIA nitrides, Power Devices, Photonics, Optical interconnects, Large-area Electronics, Nonlinear Optics in Fibers, Optical Signal Processing, and 2D materials – heterostructures and devices.

Facilities

  • Probe Station 1 PM5 (With thermal chuck)​
  • Probe Station 2 PM5 (With Pulsed source)
  • Probe Station 3-LowTemp LN2(77K-400K) IV-CV
  • Probe Station 4(He) 5k-500k
  • Electromagnetic station electrical characterization – MNCF
  • Mercury Probe Station
  • RF Probe Stn-Network Analyzer (10Mhz-67Ghz)​
  • VSM-VersaLab
  • CFMS-PPMS
  • Impedance Analyzer 4294A
  • PARK SYSTEMS NX20 AFM
  • BRUKER DIMENSION ICON AFM -1
  • BRUKER DIMENSION ICON AFM -2
  • Oxford MFP 3D Origin+
  • Micro System Analyzer (MSA 500)
  • Micro UTM
  • Optical Profilometer
  • Radiant System
  • Rheometer
  • Scanning Acoustic Microscope
  • SEM with EDS
  • FIB-HELIOS 5 UX DUAL BEAM
  • TEM-TITAN Themis D3391
  • X-Ray Photoelectron Spectroscopy
  • Ultra55 FE-SEM Carl Zeiss mono
  • Dimpler
  • Ultrasonic Disc cutter(Model 651)
  • Plasma Cleaner
  • Low Speed SAW – Isomet
  • MultiPrep 8″ Precision Polishing Systems
  • PIPS II Model 695
  • Gold Sputtering- Quorum
  • Gold Sputtering-Jeol
  • Critical Point Dryer
  • LabRam HR
  • XRD-Powder and Thin Film
  • XRD-Four circle & IN-PLANE
  • UV-VIS-NIR PerkinElmer Lambda 1050+ Spectrometer
  • Fourier Transform infrared spectroscopy (FTIR)
  • Simultaneous thermal analyzer (STA)
  • Solar Simulator
  • Quantum Efficiency System
  • Zeta-PALS Analyzer
  • FLS1000 Photoluminescense Spectrometer
  • Leica Optical Microscope DM 2500-M
  • Leica Stereo Microscope S6D
  • Laser scanning confocal microscope
  • Lieca flourescence microscope
  • BIOWING – Cancer biology lab

FAQs

Click here to get access.

Biometric access is required to enter the facility for which the student needs to fill a form. This automatically sends a mail to his supervisor with two links- approval or disapproval. (Email sent to the supervisor is from his student’s institute email id and not from cense id).

  • Once registration is complete, choose instruments under MNCF. Read the policies and agree with its content.
  • The student will receive an acknowledgment and approval notification from FOM, after which he can book the slots
  • Maximum time allowed for a slot is 1 hour. However if you want to use an equipment for more than an hour, you can book multiple slots
  • All dependent users must select “Manager Assistant Required” while booking the slots
  • Independent users who need FT help, please select this “Manager Assistant Required” option, while booking the slots
  • Independent users should not submit the samples to FT for analysis. Doing so, will avail penalty points

Two options are available. Either you can log onto FOM using your user name and password or visit the Facilities page.

http://www.mncf.cense.iisc.ac.in, select Facilities or contact Facility Technologists (2293 3181 Ext 134 (Optical) 135 (Material) 136 (Mechanical) 137 (Electrical) 133 (TEM)