• Name: PARK SYSTEMS NX20 AFM
•  Tool No.: MNCF 011
•  Make : Park Systems

Atomic Force Microscope (AFM) is a very-high-resolution type of scanning probe microscope (SPM). It is designed to measure local properties, such as height, friction, magnetism, etc., with a sharp probe by raster scanning over a small area of a sample. Atomic force microscopy technique can demonstrate a vertical resolution of the order of fractions of a nanometer and also lateral resolution more than 20x times better than the optical diffraction limit

• Name: BRUKER DIMENSION ICON AFM -1
• Tool No.: MNCF 012
•  Make : Bruker

Atomic Force Microscope (AFM) is a very-high-resolution type of scanning probe microscope (SPM). It is designed to measure local properties, such as height, friction, magnetism, etc., with a sharp probe by raster scanning over a small area of a sample. Atomic force microscopy technique can demonstrate a vertical resolution of the order of fractions of a nanometer and also lateral resolution more than 20x times better than the optical diffraction limit

• Name: BRUKER DIMENSION ICON AFM -2
• Tool No.: MNCF 013
• Make : Bruker

Atomic Force Microscope (AFM) is a very-high-resolution type of scanning probe microscope (SPM). It is designed to measure local properties, such as height, friction, magnetism, etc., with a sharp probe by raster scanning over a small area of a sample. Atomic force microscopy technique can demonstrate a vertical resolution of the order of fractions of a nanometer and also lateral resolution more than 20x times better than the optical diffraction limit

• Name: Oxford MFP 3D Origin+
•  Tool No.: MNCF055
•  Make : Oxford

The MFP-3D Origin+ is an extremely versatile and high performance research AFM ready for almost any field of research. It features the same core performance as the MFP-3D Origin but includes support for the complete range of innovative MFP-3D accessories.

Name: MICRO SYSTEM ANALYSER (MSA 500)

Tool No.: MNCF 014

Make : Polytec

• The Micro System Analyzer is the premier measurement tool for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS. By fully integrating a microscope with scanning laser doppler vibrometry, stroboscopic video microscopy and scanning white light interferometry, the Micro System Analyzer is designed with an all-in-one combination of technologies that clarifies real microstructural response and topography.
• Polytec Micro System Analyzer combines three highly sophisticated measuring techniques in one instrument permitting a comprehensive investigation of a microstructure without moving the device to another test station..

• Name: Micro UTM
•  Tool No.: MNCF 017
•  Make : Mecmesin

A universal testing machine (UTM), also known as a universal tester, materials testing machine or materials test frame, is used to test the tensile strength and compressive strength of materials.

A universal testing machine (UTM), also known as a universal tester, materials testing machine or materials test frame, is used to test the tensile strength and compressive strength of materials. An earlier name for a tensile testing machine is a tensometer. The “universal” part of the name reflects that it can perform many standard tensile and compression tests on materials, components, and structures (in other words, that it is versatile).

• Name: Optical Profilometer (Taylor Hobson/Talysurf CCI)
• Tool No.: MNCF 016
• Make : Ametek

Profilometer is a measuring instrument used to measure surface profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography. An optical profilometer is a non-contact method for providing much of the same information as a stylus based profilometer.

Optical profilometer uses Principle of Coherence Correlation Interferometry (CCI) in surface topography measurements. The CCI methods are based on the cross-coherence analysis of two low-coherent light beams, the object beam being reflected from the object , while the reference beam is reflected from a reference mirror.

• Name: Radiant System
• Tool No.: MNCF060
• Make : Radiant Technologies Inc

Meet the Precision Multiferroic II Ferroelectric Tester. It has a unique frequency rating of 270KHz at +/-100V built-in to the system. The Multiferroic II tester makes testing of thin films and bulk ceramics a fast and simple process. It captures 32,000 points at 2 MHz to achieve exquisite frequency resolution in DLTS or PAINT measurements.​

The Precision Multiferroic II is offered with a variety of internal amplifiers. The Multiferroic II is offered with a ±100V, 200V and 500V built-in drive volt option. It can be expanded to 10kV with the addition of a high voltage interface and an amplifier.​

• Name: Rheometer
•  Tool No.: MNCF 020
•  Make : Anton Paar

A rheometer is a precision instrument that contains the material of interest in a geometric configuration, controls the environment around it, and applies and measures wide ranges of stress, strain, and strain rate. Rheometry refers to the experimental technique used to determine the rheological properties of materials; rheology being defined as the study of the flow and deformation of matter which describes the interrelation between force, deformation and time.

There are a number of rheometric tests that can be performed on a rheometer to determine flow properties and viscoelastic properties of a material, and it is often useful to deal with them separately

The cone and plate rheometer provides a measurement of shear stress and first normal stress difference in a geometry that results in a uniform shear rate throughout the shearing gap. The conical plate of 40mm and 50 mm, parallel plate 25 mm are available.

• Name: Scanning Acoustic Microscope
•  Tool No.: MNCF 015
•  Make : KSI

A scanning acoustic microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called scanning acoustic tomography). It is commonly used in failure analysis and non-destructive evaluation. It also has applications in biological and medical research. The semiconductor industry has found the SAM useful in detecting voids, cracks, and delaminations within microelectronic packages.

Scanning acoustic microscopy works by directing focused sound from a transducer at a small point on a target object. Sound hitting the object is either scattered, absorbed, reflected (scattered at 180°) or transmitted (scattered at 0°). It is possible to detect the scattered pulses travelling in a particular direction.