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Your One Source for Materials, Device Characterization and Analysis

The MNCF offers a wide variety of material and device characterization services enabled by the more than 50 pieces of equipment housed under a single roof at CeNSE, IISc, together with experienced staff. We also network with other laboratories to enhance the breadth of our services and are in collaborative agreements with instrument manufacturers and suppliers, allowing us to offer characterization services not available from a single source in India or abroad. As CeNSE also houses the National Nano Fabrication Facility and a number of other research laboratories, we are able, when called for, to tap into in-house expertise in multi-disciplinary domains like MEMS-NEMS, Nanoelectronics Devices, Sensors, Circuits, Plasmonics, Polymer Bio Sensors, Micro-Nano Fluidics, Microsystems Packaging, Growth of IIIA nitrides, Power Devices, Photonics, Optical interconnects, Large-area Electronics, Nonlinear Optics in Fibers, Optical Signal Processing, and 2D materials – heterostructures and devices.


  • DC Probe Station 1
  • DC Probe Station 2
  • DC Probe Station 3
  • DC Probe Station 4
  • RF Probe Station 5
  • Electromagnet
  • Mercury Probe Station
  • Impedance Analyser
  • Other instruments
  • Atomic Force Microscope
  • Micro System Analyzer 500
  • Non Contact Optical Profiler
  • Scanning Acoustic Microscope, KSI v400
  • Micro UTM
  • Other Instruments
  • UHR Dual Beam FIB System: Helios NanoLAB 600i (FEI)
  • SEM with EDS
  • SEM with MonoCL
  • Multi-technique X-ray Photoelectron Spectroscopy with XPS-mapping capability
  • Transmission Electron Microscope
  • Powder/thinfilm XRD
  • Four circle XRD (HR XRD)
  • Raman and MicroPL System
  • UV-VIS-NIR Spectrometer
  • Zeta Phase Analysis Light Scattering (Zeta PALS)
  • Fourier Transform infrared spectroscopy (FTIR)
  • Simultaneous Thermal Analyser 8000 (STA 8000)
  • Sol3A Class AAA Solar Simulator
  • Internal Quantum Efficiency 200
  • Leica DM250


Click here to get access.

Biometric access is required to enter the facility for which the student needs to fill a form. This automatically sends a mail to his supervisor with two links- approval or disapproval. (Email sent to the supervisor is from his student’s institute email id and not from cense id).

  • Once registration is complete, choose instruments under MNCF. Read the policies and agree with its content.
  • The student will receive an acknowledgment and approval notification from FOM, after which he can book the slots
  • Maximum time allowed for a slot is 1 hour. However if you want to use an equipment for more than an hour, you can book multiple slots
  • All dependent users must select “Manager Assistant Required” while booking the slots
  • Independent users who need FT help, please select this “Manager Assistant Required” option, while booking the slots
  • Independent users should not submit the samples to FT for analysis. Doing so, will avail penalty points

Two options are available. Either you can log onto FOM using your user name and password or visit the Facilities page., select Facilities or contact Facility Technologists (2293 3181 Ext 134 (Optical) 135 (Material) 136 (Mechanical) 137 (Electrical) 133 (TEM)