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Micro Nano Characterization Facility
Indian Institute of Science Bangalore
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Electrical Characterization
Mechanical Characterization
Material Characterization
Optical Characterization
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Facilities
Electrical Characterization
DC Probe Station 1 (PM5 with Thermal Chuck, Agilent Device Analyzer B1500A)
DC Probe Station 2 (PM5, Agilent Device Analyzer B1500A with pulsed source 5 MHz)
DC Probe Station 3
DC Probe Station 4
RF Probe Station
Electromagnet
Mercury Probe Station
Impedance Analyser
Other instruments
Mechanical Characterization
Atomic Force Microscope
Micro System Analyzer 500
Non Contact Optical Profiler
Scanning Acoustic Microscope, KSI v400
Micro UTM
Rheometer
Other instruments
Material Characterization
UHR Dual Beam FIB System: Helios NanoLAB 600i (FEI)
SEM with EDS
SEM with MonoCL
Multi-technique X-ray Photoelectron Spectroscopy with XPS-mapping capability
Transmission Electron Microscope (Titan Themis 300kV from FEI, now Thermo)
SEM and TEM Sample Preparation Techniques
Optical Characterization
Powder/thinfilm XRD
Four circle XRD (HR XRD)
Raman and MicroPL System
UV-VIS-NIR Spectrometer
Zeta Phase Analysis Light Scattering (Zeta PALS)
Simultaneous Thermal Analyser 8000 (STA 8000)
Sol3A Class AAA Solar Simulator
Newport Oriel – Internal Quantum Efficiency 200
Leica DM2500
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+91 80 22933253, +91 80 22933181
mncf.cense@iisc.ac.in
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Home
About
Our Team
Facilities
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Electrical Characterization
Mechanical Characterization
Material Characterization
Optical Characterization
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