- Name: XRD-Powder and Thin Film
- Tool No.: MNCF 030
- Make : Rigaku
Micro Nano Characterization Facility
ISO 9001:2015 and ISO 45001:2018 Facility
Indian Institute of Science Bangalore
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- Facilities
- Electrical Characterization
- Probe Station 1 PM5 (With thermal chuck)
- Probe Station 2 PM5 (With Pulsed source)
- Probe Station 3-LowTemp LN2(77K-400K) IV-CV
- Probe Station 4(He) 5k-500k
- Electromagnetic station electrical characterization – MNCF
- Mercury Probe Station
- RF Probe Stn-Network Analyzer (10Mhz-67Ghz)
- VSM-VersaLab
- CFMS-PPMS
- Impedance Analyzer 4294A
- Mechanical Characterization
- Material Characterization
- SEM with EDS
- FIB-HELIOS 5 UX DUAL BEAM
- TEM-TITAN Themis D3391
- X-Ray Photoelectron Spectroscopy
- Ultra55 FE-SEM Carl Zeiss mono
- Dimpler
- Ultrasonic Disc cutter(Model 651)
- Plasma Cleaner
- Low Speed SAW – Isomet
- MultiPrep 8″ Precision Polishing Systems
- PIPS II Model 695
- PIPS II Model 695
- Gold Sputtering- Quorum
- Gold Sputtering-Jeol
- Critical Point Dryer
- Optical Characterization
- LabRam HR
- XRD-Powder and Thin Film
- XRD-Four circle & IN-PLANE
- UV-VIS-NIR PerkinElmer Lambda 1050+ Spectrometer
- Fourier Transform infrared spectroscopy (FTIR)
- Simultaneous thermal analyzer (STA)
- Solar Simulator
- Quantum Efficiency System
- Zeta-PALS Analyzer
- FLS1000 Photoluminescense Spectrometer
- Leica Optical Microscope DM 2500-M
- Leica Stereo Microscope S6D
- Bio Lab
- Electrical Characterization
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