• Name: PARK SYSTEMS NX20 AFM
•  Tool No.: MNCF 011
•  Make : Park Systems

Atomic Force Microscope (AFM) is a very-high-resolution type of scanning probe microscope (SPM). It is designed to measure local properties, such as height, friction, magnetism, etc., with a sharp probe by raster scanning over a small area of a sample. Atomic force microscopy technique can demonstrate a vertical resolution of the order of fractions of a nanometer and also lateral resolution more than 20x times better than the optical diffraction limit