• Name: Mercury Probe station
• Tool No.: MNCF 007
• Make : MDC’s Mercury Probes

MDC’s Mercury Probes are built for measuring samples without the need of creating metallic contacts. They are used for temporary, non-destructive contact to MOS and bare semiconductor samples at room temperature. They are excellent for monitoring wafer doping and resistivity. Mercury probes work well, for example, with Graphene (FLG), GaN, GaAs and GaP material. The probes work in both front-front and front-back contact configurations.

General Features:-

• Doping Profiles of bulk or epitaxial layers
• MOS characterization
• Permittivity of Dielectrics
• Detection of residual films on conducting substrates
• Current-Voltage testing of Photovoltaic devices