LabRam HR
- Name: LabRam HR
- Tool No.: MNCF 031
- Make : HORIBA JOBIN VYON
Raman spectroscopy is a spectroscopic technique typically used to determine vibrational modes of molecules, although rotational and other low-frequency modes of systems may also be observed. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified.
Raman spectroscopy relies upon inelastic scattering of photons, known as Raman scattering. A source of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range is used, although X-rays can also be used. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system. Infrared spectroscopy typically yields similar yet complementary information.
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LabRam HR
Wide scanning range: 300nm to 1500nm
● Wide spectral range: 60cm-1 to 4000cm-1
● Spectral Resolution: 0.35 cm-1/pixels at 532nm with 1800 gr/mm.
● Spatial Resolution: High spatial resolution of 1μm
● Three different excitation sources: 532nm,785nm and 266nm.
● InGaAs detector for NIR PL measurements (800nm to 1500nm)
● Gratings :1800 Groves /mm and 600 grooves /mm
● Measurements : single point raman, Mapping, pl spectra
● Mapping min. Step size: 0.1 μm
Technical Documents
Status: Operational
Sample requirement: liquid, powder, thinfilms- 100nm thickness (min.)
Location: MNCF, Optical Bay
Training Videos: Raman Training_V2.mp4
Additional NotesXRD-Powder and Thin Film
- Name: XRD-Powder and Thin Film
- Tool No.: MNCF 030
- Make : Rigaku
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X Ray source – Cu K alpha- 1.54 angstrom, 40kV, 30mA
Max Operating power – 1.2 kW
2 theta range: 2 to 160 deg (theta/2theta scan)*
2 to 120 deg (2theta GIXRD scan)*
Optics: Bragg-Brentano (BB) for Powder/Bulk and Parallel beam (PB) for thin films
Sample stage: Standard height reference(Z) stage, Chi-Phi stage, Automatic sampling and spinning stage.
Detector: Scintillation counter 0D (SC) and D/tex 1D (Si)
Note: *2theta can be started from 0 by compromising the intensity.
Modes |
Powder/bulk/Polymer XRD |
Spinning Powder XRD mode (0 to 120 rpm) |
Thin film Theta-2theta XRD |
Grazing incidence XRD |
Rocking curve/crystal quality analysis |
Pole-figure/Texture measurement |
Reciprocal space mapping |
Residual stress measurement |
Xray reflectivity measurement (Measurable thickness ≤100nm approx.) |
Technical Documents
Status: Operational
Sample requirement: Amorphous, polycrystalline materials, in the form of powder, bulk and thin films sample of minimum 2mm*2mm area and maximum 10mm thickness.
Location: MNCF, Optical Bay
Training Videos: Cense XRD Training.MOV
Additional NotesXRD-Four circle & IN-PLANE
- Name: XRD-4 Circle and in-plane
- Tool No.: MNCF 029
- Make : Rigaku
In addition to the powder XRD capabilities, Four Circle- Inplane XRD has high resolution mode and additionally extract the information of the epitaxial relationship between the film and the substrate in terms of orientation relationship, mosaicity and strain.
Applications:
XRD- Pole Figure measurement, Rocking Curve, Reciprocal space mapping, Residual stress, X-ray mapping, Temperature induced phase transition investigations.
XRR for thin films – thickness, density, roughness.
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Tool Specifications : X Ray source – Cu K alpha- 1.5418 angstrom,
40kV, 30mA. Monochromator – Ge 2 bounce and 4 bounce.
Max Operating power – 1.2 kW
Sample stage: Chi-Phi stage, DCS 500 doomed heating/ cooling, X-Y stage.
Detector: Scintillation counter 0D (SC) and high Speed 2D (Pilatus)
Temeperature dependent Doomed Cooling Stage Specifications –
Vacuum – 10-3 mbar, Temperature range : -180 ℃ to 500 ℃ , Dome material – Graphite (T% – 65%), Sample diameter : 25 mm max, 5 mm , Desired angular range – Theta – 2 Theta – 0 to 160 degrees, Phi – 0 to 55 degrees, Chi – 0 to 5 degrees
Sample Requirements:
Substrate Type | Bulk samples such as powder, polymer, flat samples, thick films, Wafers, Glass.
Thin films such as polycrystalline, textured, epitaxial films. |
The Bragg’s law can only be applied when the sample is flat. |
Sample size | Minimum – 3 mm * 3 mm, Maximum – 100 mm * 100 mm.
DCS – diameter – maximum- 29mm |
Samples smaller than the specified dimensions or height may lead to inaccurate data, as X-rays may interact with the steel stage or other components, resulting in false readings and yield weak intensity counts.
Exceeding the specified sample dimensions and height can result in space constraints and alignment issues with the XRD optics setup. |
Maximum and Minimum Height | Height minimum – 5 nm.
Height maximum – 4mm. DCS – height maximum – 2 mm. |
Instrument | Vendor/Model | Specifications | Modes Available |
Four Circle- Inpalne XRD | Rigaku / Smart Lab XRD | •X Ray source – Cu Kalpha- 1.5418 angstrom, 40kV, 30mA
•Monochromator – Ge 2 bounce and 4 bounce. •Max Operating power – 1.2 kW •Optics: Bragg-Brentano (BB) for Bulk and Parallel beam (PB) for thin films •Sample stage: Chi-Phi stage, DCS 500 doomed Heating/ cooling, •Detector: Scintillation counter 0D (SC) and high Speed 2D (Pilatus) |
•Powder/bulk/Polymer XRD using OD, 2D
•Thin film Theta-2theta XRD •Grazing incidence XRD •Rocking curve/crystal quality analysis •Pole-figure/Texture measurement •Reciprocal space mapping •Residual stress measurement •Xray reflectivity measurement •Temperature dependent XRD |
Technical Documents
Status: Operational
Sample requirement: Amorphous, polycrystalline materials, in the form of powder, bulk and thin films sample
Location: MNCF, Optical Bay
Training Videos: Cense XRD Training.MOV
Additional NotesUV-VIS-NIR PerkinElmer Lambda 1050+ Spectrometer
- Name: UV-VIS-NIR PerkinElmer Lambda 1050+
- Tool No.: MNCF 054
- Make : PerkinElmer
Double-beam, double-monochromator, ratio-recording UV-VIS-NIR spectrophotometer with Deuterium lamp for UV source and Tungsten-halogen lamp for VIS-NIR source. Instrument has a 175-3300 nm scanning range with 3 detectors (PMT, InGaAs and PbS detectors) and an Integrating sphere module (2-detector) to measure total and diffuse reflectance. Modes of measurement: Absorbance, Transmittance (Direct and Diffuse), Reflectance (Diiffuse, Specular and Total).
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UV-VIS-NIR PerkinElmer Lambda 1050+ spectrophotometer
– Detectors – Photomultiplier R6872 (PMT) for high energy for the entire UV-Vis wavelength range (175-860 nm); InGAs and PbS detectors for NIR wavelength range (860-3300 nm)
– Source – Pre-aligned Tungsten – Halogen lamp (319-3300 nm) and Deuterium lamp (175-319 nm)
– Wavelength range( N2 purge required below 200nm) – 175-3300nm
– UV Vis resolution – ≤ 0.05nm
– NIR resolution – ≤ 0.20nm
– Wavelength accuracy – ±0.080 nm UV/Vis , ±0.300 nm NIR
Modes
1. Transmittance in 3D/2D module (Thin films/Liquids)
2. Absorbance in 3D/2D module (Thin films/Liquids)
3. Total Reflectance in 2D Integrating sphere module (Thin films/Powders)
4. Diffuse Reflectance in 2D Integrating sphere module (Thin films/Powders)
5. Specular Reflectance in 3D module (Thin films only)
Technical Documents:
Status: Operational
Sample requirement: Thin film samples-Transmittance/Absorbance mode: 50mm wide x 90mm high x 3mm thick (Maximum), 3mm x 3mm x 3mm (Minimum); Reflectance samples: 3mm × 3mm × 3mm (Minimum). Liquid samples – 5 mL for samples, 10mL for Reference standards/Blanks (Minimum volume), Powders (Quantity required: 50-100 mg)
Location: MNCF, Optical Bay
Training Videos: UV PerkinElmer Lambda 1050+ Training video
Additional NotesFourier Transform infrared spectroscopy (FTIR)
- Name: Fourier Transform infrared spectroscopy (FTIR)
- Tool No.: MNCF 035
- Make : PerkinElmer- Frontier
Fourier Transform infrared spectroscopy (FTIR) is a technique which is used to obtain an infrared spectrum of absorption or emission of a solid, liquid or gas. An FTIR spectrometer simultaneously collects high spectral resolution data over a wide spectral range.
A common FTIR spectrometer consists of a source, interferometer, sample compartment, detector, amplifier, A/D converter, and a computer.
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Fourier Transform infrared spectroscopy (FTIR)
– Mid-IR (KBr) beamsplitter spectral range: 7800-400 cm-1
– UATR module range: 7800-650 cm-1
– Spectral resolution: 0.5-64 cm-1
– Wavelength Repeatability: ±0.02 cm at 1,600 cm
– Wavelength accuracy: ±0.1 cm at 1,600 cm
– Detectors: TGS and Liquid nitrogen cooled MCT
Modes
1. Transmittance using Slide holder mode (Thin films/Powders/Bulk samples)
2. Absorbance using Slide holder mode (Thin films/Powders/Bulk samples)
3. Fixed/Variable Specular Reflectance using Slide holder mode (Thin films only)
4. UATR module (Polymers/Bulk samples/Liquids/Powders without metal oxides)
Technical Documents
Status: Operational
Sample requirement: sample size; more than 1x1cm, Glass substrate can not be used in transmission mode, Water can not used in ATR mode
Location: MNCF, Optical Bay
Training Videos: FTIR.mp4
Additional NotesSimultaneous thermal analyzer (STA)
- Name: Simultaneous thermal analyzer (STA)
- Tool No.: MNCF 034
- Make : PerkinElmer- STA8000
Simultaneous thermal analyzer measures both heat flow (Differential Scanning Calorimetry) and weight changes (thermogravimetry) in a material as a function of temperature or time in a controlled atmosphere. The instrument can preciously correlate enthalpy changes to the TGA events resulting from mass loss.
Samples are heated in open alumina crucibles where TGA, DTA and DSC data are acquired. temperature or time in a controlled atmosphere.
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Simultaneous thermal analyzer (STA)
· Simultaneous analysis of TG with DTA mode.
· Temperature ranges from 30°C temperature to 900 °C.
· Heating rate 5 degree per minute to 25 degrees per minute (till 900 °C).
· Nitrogen inert gas environment
· Top loading balance
· Balance below furnace for optimum isolation from contamination
Modes
1. Thermogravimetric analysis (TGA) mode – Powders, bulk samples, Liquids
2. Differential Scanning Calorimetry (DSC) mode – Only heating curve – Powders, bulk samples, Liquids
3. TG-IR (Available on request)
Technical Documents
Status: Operational
Sample requirement: powder samples 10-20 mg, User must send MSDS of the sample, while requesting for sample analysis
Location: MNCF, Optical Bay
Training Videos: STA Training video
Additional NotesSolar Simulator
- Name: Solar Simulator-
- Tool No.: MNCF 032
- Make : Newport
Oriel Sol3A solar simulators use a single lamp design to meet Class A requirements for all three performance criteria without compromising 1 SUN output power. By convention, Class AAA is reported with the first letter representing Spectral performance, the second letter Uniformity of Irradiance, and the third letter Temporal Stability.
An ideal spectral match for a solar simulator is based on the percentage of the integrated light intensity in 6 spectral ranges. A Class AAA solar simulator may not deviate more than 0.75 to 1.25 times the ideal percentage in each spectral range.
Modes : IV measurements; Current-Time graph
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Simulator Class | Class AAA |
Lamp Type | Xenon |
Lamp Wattage | 450 W |
Output Beam Size | 2 x 2 in. |
Beam Uniformity | ≤2% |
Beam Divergence, Half Angle | <±4 ° |
Typical Output Power | 100mW/cm2 (1 Sun)±20% Adjustable |
Uniformity | ≤2 % |
Working Distance | 12.0 ±0.5 in. |
Technical Documents
Status: Operational
Sample requirement:
Location: MNCF, Optical Bay
Training Videos: Solar Simulator Training Video
Additional NotesQuantum Efficiency System
- Name: Quantum Efficiency System
- Tool No.: MNCF 036
- Make : Newport
Oriel instrument’s IQE 200 system allows users to measure External Quantum Efficiency also known as Incident Photon to Charge Carrier Efficiency (IPCE) as well as Internal Quantum Efficiency for solar cells, detectors, or any other photon to charge converting device. The device utilizes industry standard Oriel components for the tunable light source.
The IQE-200 system provides a turnkey solution by providing light source, monochromator, detectors, related electronics, software and PC in preconfigured assembled and calibrated format. Accessory modules are available to provide sample positioning, temperature control, electrical probing capabilities and light/voltage bias.
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Quantum Efficiency System
– Wavelength Range: 350nm – 1100nm
– Wavelength accuracy is 0.5 nm
– Repeatability is +/-0.2% from 400 – 1000 nm
– Spectral resolution: 5 nm(adjustable)
– Spot size: 1*2.5 mm
– QTH lamp
– Sample Size: 2 x 2 to 6 x 6 inch
Technical Documents
Status: Operational
Sample requirement: Bulk samples such as pellets, polymer, flat samples, thick films, Wafers, Glass.. The samples should have contact pads/wires for IV measurements
Location: MNCF, Optical Bay
Training Videos: Quantum Efficiency Training video
Additional NotesZeta-PALS Analyzer
- Name: Zeta-PALS Analyzer
- Tool No.: MNCF 028
- Make : Brookhaven
ZetaPALS zeta potential analyzer is used to measure electrophoretic mobility, zeta potential and particle size of the particles dispersed in a suspension using Phase Analysis Light Scattering (PALS) principle.
With concepts developed at Bristol University and Brookhaven Instruments, the NanoBrook ZetaPALS determines zeta potential using Phase Analysis Light Scattering: A technique that is up to 1,000 times more sensitive than traditional light scattering methods based on the shifted frequency spectrum.
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Zeta-PALS Analyzer
– The instruments range – low range: 0 – 28 V/cm, 1 to 250 Hz, sine or square wave.
– high range: 29 – 555 V/cm, same timing characteristics.
– Zeta Potential Range: -500 mV to 500 mV
– Maximum Sample Conductivity: 220 mS/cm
– Concentration Range: 2 ppm to 50 mg/mL
– Size Range: 1 nm to 100 μm
Modes
1. Particle size measurements
2. Zeta potential measurements
Technical Documents
Status: Operational
Sample requirement: Powder samples, Liquid samples (10% v/v)
Location: MNCF, Optical Bay
Training Videos: ZetaPALS Training video
Additional NotesFLS1000 Photoluminescense Spectrometer
- Name: FLS 1000, Photoluminesence Spectrometer
- Tool No.: MNCF 057
- Make : Edinburgh instruments
The FLS1000 is a state-of-the-art, modular photoluminescence spectrometer designed to meet the demands of the most challenging applications in Photo physics, Photochemistry, Material Sciences, and Life Sciences.
Setting the standard in both steady-state and time-resolved photoluminescence spectroscopy, the FLS1000 is ideal for fundamental research as well as routine laboratory use.
This versatile system spans the ultraviolet to visible spectral range, measuring lifetimes from nanoseconds to seconds. The FLS1000 enables reliable and accurate measurements of luminescence spectra and kinetics, leveraging advanced light sources, high-performance detectors, cutting-edge acquisition techniques, and high-quality optics.
With its spacious sample chamber, the FLS1000 accommodates a wide variety of sample accessories, making it suitable for diverse experimental setups. High sensitivity is a hallmark of the FLS1000, ensuring precise measurements even for low sample concentrations, small volumes, or samples with low quantum yields
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- Excitation lasers: 375 nm (pulsed) 450nm (pulsed), 400nm (CW)
- Spectral range: 385nm to 850nm
- Pulse period: EPL 375nm- 50s to 50ns; HPL 450nm- 12.5ns to 1s
- Pulse width: 375nm – 60ps at 10MHz; 475nm – 95ps at 80MHz
- Minimum step size: 0.01nm
Modes:
- TCSPC
- Photolumiscence spectra
- PLQY (Direct and indirect method)
Technical Documents
Status: Operational
Sample requirement:
Location: MNCF, Optical Bay
Training Videos:
Additional NotesLeica Optical Microscope DM 2500-M
- Name: Leica Optical Microscope DM 2500-M
- Tool No.: MNCF 048
- Make : Leica
Differential interference contrast and high-performance fluorescence capability of the microscope can be used to study various properties of the sample.
General Features:-
- Objectives 2.5X, 10X, 20X, 40X, 100X
- Oil immersion capability
- Filters: red, green and blue
- Binocular
- Digital camera (DFC 450C)
- Image resolution : 5 megapixels
- Bright field, Dark field and fluorescence applications
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