• Name: XRD-4 Circle and in-plane
• Tool No.: MNCF 029
• Make : Rigaku

In addition to the powder XRD capabilities, Four Circle- Inplane XRD has high resolution mode and additionally extract the information of the epitaxial relationship between the film and the substrate in terms of orientation relationship, mosaicity and strain.

Applications:

XRD- Pole Figure measurement, Rocking Curve, Reciprocal space mapping, Residual stress, X-ray mapping, Temperature induced phase transition investigations.
XRR for thin films – thickness, density, roughness.